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Table 1 Parameters for Testing
Strain load can be simulated when a shunt resistor is connected to the Wheatstone bridge
in parallel to the active gauge. For the first output testing, three different shunt resistors are used
to simulate three different strains for each signal conditioner. For each shunt resistor, five
readings are taken with each signal conditioner. The three shunt resistors used in this testing
have the resistance of 12.88kΩ, 35.92kΩ, and 45.05kΩ, simulating strains of 4406 micro strain,
1751 micro strain, and 1268 micro strain respectively.
The shunt resistor is connected to the circuit before the recording starts. It is disconnected
from the circuit approximately five seconds after the recording starts. The recording continues
for 10 to 15 seconds until the readings stabilize for at least five seconds. A voltage reading is
acquired by calculating the absolute difference between the average voltage before disconnecting
the shunt resistor, and the average voltage after the signal stabilizes. The strain reading is given
by expression:
where
is the voltage reading, Gain is the amplifier gain,
is the excitation voltage,
and F is the excitation voltage.
The strain readings are evaluated for noise, accuracy and precision. The results of these
three parameters are compared for the four tested systems to eliminate systems with undesirable
performance.
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